International Conference on Spectroscopic Ellipsometry
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The International Conference on Spectroscopic Ellipsometry (abbreviated ICSE) was founded in 1993 as a scientific conference consisting of researchers from all around the world to discuss recent developments and their applications in the field of spectroscopic ellipsometry. The ICSE provides a forum for scientists and engineers working on the instrumentation, optics science, and applications of spectroscopic ellipsometry and related techniques. Since 2007, the conference has convened every three years, and the next conference is scheduled to take place in Beijing, China, in 2022.
The conference consists of several days of oral presentations, poster presentations, and exhibitions of commercial ellipsometry companies. After every meeting, the proceedings of the conference are published in a scientific journal, such as Thin Solid Films, Physica Status Solidi A, Applied Surface Science, and Journal of Vacuum Science and Technology B.
Since 2007, the ICSE has awarded the Paul Drude Award, named after physicist Paul Drude, to young scientists for "exceptional contributions to the development and application of spectroscopic ellipsometry" at each meeting.[1]
List of Conferences[edit]
| No. | Location | Year | Dates | Chair | Proceedings |
|---|---|---|---|---|---|
| 1 | Paris, France | 1993 | January 11–14 | A. C. Boccara, J. Rivory | Thin Solid Films, Vols. 233 and 234, 1993[2][3] |
| 2 | Charleston, South Carolina, USA | 1997 | May 12–15 | Eugene A. Irene | Thin Solid Films, Vols. 313 and 314, 1998[4] |
| 3 | Vienna, Austria | 2003 | July 6–11 | Josef Humlíček | Thin Solid Films, Vols. 455 and 456, 2004[5] |
| 4 | Stockholm, Sweden | 2007 | June 11–15 | Hans Arwin | Physica Status Solidi A, 2008[6] |
| 5 | Albany, New York, USA | 2010 | May 23–29 | Alain Diebold | Thin Solid Films, Vol. 519, 2011[7] |
| 6 | Kyoto, Japan | 2013 | May 26–31 | Hiroyuki Fujiwara | Thin Solid Films, Vol. 571 Part 3, 2014[8] |
| 7 | Berlin, Germany | 2016 | June 6–10 | Norbert Esser | Applied Surface Science, Vol. 421 Part B, 2017[9] |
| 8 | Barcelona, Spain | 2019 | May 26–31 | Maria Isabel Alonso | Journal of Vacuum Science and Technology B (To Be Released) |
| 9 | Beijing, China | 2022 | TBD | Gang Jin |
Paul Drude Award Winners[edit]
| Year | Recipient | Institution |
|---|---|---|
| 2007 | Peter Petrik | Research Centre for Natural Sciences, Hungary |
| 2010 | Tino Hofmann | University of Nebraska-Lincoln, USA |
| 2013 | Vanya Darakchieva | Linköping University, Sweden |
| 2016 | Oriol Arteaga | University of Barcelona, Spain |
| Christoph Cobet | Johannes Kepler University, Austria | |
| 2019 | Eva Bittrich | Leibniz Institute of Polymer Research Dresden, Germany |
| Chris Sturm | University of Leipzig, Germany |
List of Prior Conferences[edit]
Prior to the beginning of the ICSE, five other conferences focusing on the subject of ellipsometry were held between 1963 and 1983.
| No. | Location | Year | Dates | Title | Proceedings |
|---|---|---|---|---|---|
| 1 | Washington, DC, USA | 1963 | September 5–6 | Ellipsometry in the Measurement of Surfaces and Thin Films Symposium | National Bureau of Standards, Misc. Pub. 256[10] |
| 2 | Lincoln, Nebraska, USA | 1968 | August 7–9 | Second International Conference on Ellipsometry | Surface Science, Vol. 16, 1969[11] |
| 3 | Lincoln, Nebraska, USA | 1975 | September 23–25 | Third International Conference on Ellipsometry | Surface Science, Vol. 56, 1976[12] |
| 4 | Berkeley, California, USA | 1979 | August 20–22 | Fourth International Conference on Ellipsometry | Surface Science, Vol. 96, 1980[13] |
| 5 | Paris, France | 1983 | June 7–10 | International Conference on Ellipsometry and Other Optical Methods for Surface and Thin Film Analysis | Le Journal de Physique Colloques, Vol. 44, 1983[14] |
References[edit]
- ↑ 1.0 1.1 "Program". congresses.icmab.es.
- ↑ "Thin Solid Films | Vol 233, Issues 1–2, Pages 1-306 (12 October 1993) | ScienceDirect.com". www.sciencedirect.com.
- ↑ "Thin Solid Films | Vol 234, Issues 1–2, Pages 307-582 (25 October 1993) | ScienceDirect.com". www.sciencedirect.com.
- ↑ "Thin Solid Films | Vols 313–314, Pages 1-850 (13 February 1998) | ScienceDirect.com". www.sciencedirect.com.
- ↑ "Thin Solid Films | The 3rd International Conference on Spectroscopic Ellipsometry (ICSE-3) | ScienceDirect.com". www.sciencedirect.com.
- ↑ "physica status solidi (a) : Vol 205 , No 4". Physica Status Solidi (a). 205 (4). April 3, 2008. doi:10.1002/pssa.v205:4.
- ↑ "Thin Solid Films | 5th International Conference on Spectroscopic Ellipsometry (ICSE-V) | ScienceDirect.com". www.sciencedirect.com.
- ↑ "Thin Solid Films | 6th International Conference on Spectroscopic Ellipsometry (ICSE-VI) | ScienceDirect.com". www.sciencedirect.com.
- ↑ "Applied Surface Science | 7th_International Conference on Spectroscopic Ellipsometry | ScienceDirect.com". www.sciencedirect.com.
- ↑ https://nvlpubs.nist.gov/nistpubs/Legacy/MP/nbsmiscellaneouspub256.pdf
- ↑ "Surface Science | Vol 16, Pages CO2, x, 1-452 (August 1969) | ScienceDirect.com". www.sciencedirect.com.
- ↑ "Surface Science | Vol 56, Pages ii, vii, 1-518 (June 1976) | ScienceDirect.com". www.sciencedirect.com.
- ↑ "Surface Science | Vol 96, Issues 1–3, Pages 1-577 (June 1980) | ScienceDirect.com". www.sciencedirect.com.
- ↑ "Supplément au Journal de Physique Colloques". jphyscol.journaldephysique.org.
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