Introspect Technology
History
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Introspect Technology, also known as Introspect Test Technology, is a Montreal-based Canadian company that manufactures electronics test and measurement instruments and software[1]. Founded in 2013 by Dr. Mohamed Hafed, Ph.D., a graduate of McGill University in Electrical and Computer Engineering, Introspect Technology was spun off from DFT Microsystems[2] with the purpose of concentrating on emerging MIPI Alliance specifications for mobile and mobile-influenced technologies.
Dr. Mohamed Hafed has authored or contributed to numerous IEEE papers on the topic of high-speed mixed signal measurement and testing, including the following notable articles:
- Test and evaluation of multiple embedded mixed-signal test cores
- Oversampled multi-phase time-domain bit-error rate processing for transmitter testing
- Massively Parallel Validation of High-Speed Serial Interfaces using Compact Instrument Modules
Electronic test equipment developed by Introspect Technology is focused on increasing the convenience and usability in both laboratory and production environments. Their devices are aimed at eschewing larger ATE (Automatic Test Equipment) units by replacing them with portable, handheld SerDes test instruments, Direct-Attach SerDes transceiver endpoints, and high-performance active probes for use with oscilloscopes and related instruments from other manufacturers.
The name and logo are based on the founder's philosophy that more measurements translates into more productivity, and integrates the word “introspect” with a circular background that resembles a magnifying glass. The company's products provide faster methods to “introspect” or make more measurements, whether these measurements are for development, for bench validation, or for production, translating to enhanced productivity for electronic and mixed-signal system designers.
| Privately held company | |
| ISIN | 🆔 |
| Industry | Electronics, Embedded systems, Test and Measurement |
| Fate | Active |
| Founded 📆 | 2012 |
| Founder 👔 | Mohamed Hafed, PhD |
| Headquarters 🏙️ | , Montreal, QC , Canada |
Area served 🗺️ | North America, Europe, Middle East, Asia. |
Key people | Mohamed Hafed, PhD - Founder/CEO |
| Products 📟 | Electronic measurement equipment, Handheld SerDes testers, Direct-Attach SerDes Endpoint Modules, Integrated Development Environment (IDE) for measurement equipment. |
| Members | |
Number of employees | |
| 🌐 Website | https://www.introspect.ca |
| 📇 Address | |
| 📞 telephone | |
Products
Introspect Technology's products include hardware and software for designing and testing SerDes interfaces (such as PCI Express Gen 3, DisplayPort, Thunderbolt) , MIPI M-PHY, C-PHY and D-PHY analysis and error detection, generators for low-power (LP) and high-speed (HS) data streams, Direct-Attach SerDes transceiver endpoint modules that plug into a device under test (DUT) or board-mounted sub-system, and active probes for testing and design validation for use with generally available 50 ohm test instruments, such as oscilloscopes.
Handheld SerDes & MIPI Test Instruments: SVxC Series
The idea behind this product came from working on mobile and mobile-influenced applications and embedded systems: create a test instrument that was as compact and portable as the devices and applications it was designed to help develop and test. Colloquially referred to as the "smartphone of test and measurement equipment", the SVxC product line was built for portability between bench, lab, and field settings. This allows for avoiding issues with correlation between test equipment setups; in a test lab, engineers are traditionally tasked with correlating measurements obtained using bench equipment with corresponding measurements taken on production ATEs.
Given the completely different architecture between bench and ATE equipment, a lot of effort and time gets spent in trying to correlate measurements between test environments[3]. With the form factor and features on the SVxC products, a single test technology is deployed during early test chip proof-of-concept validation, product engineering and validation, and system-level functional test and failure analysis. Failed components can then be brought back to the bench knowing that the same tool, and the same pass/fail criteria, can be used for testing.
SV1C
The SV1C Personalized SerDes Tester is a compact instrument that created a new category of tool when it was released[4] in January of 2013. It integrates multiple technologies in order to enable the self-contained test and measurement of complex SerDes interfaces such as PCI Express Gen 3, DisplayPort, Thunderbolt, or MIPI M-PHY. The SV1C contains 8 independent stimulus generation ports, 8 independent capture and measurement ports and various clocking, synchronization and lane-expansion capabilities.
SV2C
Introduced as the world's most compact 100G SerDes Tester in March 2016, the SV2C provides a highly capable BERT (Bit Error Rate Test) solution enabling the test and validation of two 100G links (8 x 28 Gbps) simultaneously. Leveraging Introspect’s proprietary compact test architecture, the SV2C contains 8 arbitrary pattern generators with integrated jitter injection, voltage swing control, and de-emphasis control. Additionally, it contains 8 receivers with per-pin hardware clock recovery, error detection, and jitter analysis.
SV3C
Like the original SV1C, the SV3C integrates multiple technologies in order to enable the self-contained test and measurement of SerDes interfaces, such as PCI Express, MIPI M-PHY, or USB3. The SV3C is available in several variations of signal generation and receiver modes, with up to 32 total lanes in a single unit, in contrast with the standard Tx/Rx (Transmit/Receive) configuration found on the SV1C.
Direct-Attach SerDes Transceiver Endpoints
The design of these plug-in modules is to eliminate bulkier test instruments and equipment by replacing it with direct-attach units, thereby eliminating the need for cables. This provides a more accurate emulation of a target system environment for testing or prototyping. Since signal integrity and protocol handshake characterization and testing can be executed directly on your application board, the procedures that use this product form factor are referred to as endpoint testing.
SV1D
This unit features data rates from 250 Mbps to 14 Gbps, as well as 8 Tx and 8 Rx channels, and interfaces with the following controls: SPI, JTAG, I²C ports.
SV2D
Provides data rates from 19 Gbps to 28 Gbps, as well as 8 Tx and 8 Rx channels, with per channel adjustment of voltage and timing.
SV3D
This model features data rates from 250 Mbps to 14 Gbps, with 32 independent Tx and Rx differential lanes.
Software
Introspect ESP
Introspect ESP is a Graphical User Interface development environment, or IDE, that provides a PC-based interface to the output from the various test and measurement instruments in the Introspect line of products. Because hardware and electronics engineers are not necessarily software-savvy, this interface was designed to alleviate the technical hurdles typically found with development environments, and includes predetermined test scripts, or components, for standard electronic component testing procedures like bit error rate, Schmoo, and others.
Because the software was created with Python, components are readily accessed from other test environment, such as National Instruments' Labview.
Awards and recognition
- DesignCon 2015 Best in Design & Test Award for Signal Integrity/High-Speed Test: SV3C CPRX 4-Lane C-PHY Analyzer, Introspect Technology.[5]
- Finalist for ACE Design Team of the Year Award 2015.
- Finalist for ACE Executive of the Year Award 2014.
- DesignCon 2013 Best in Design & Test Award (under DFT Microsystems a.k.a. Introspect Test Technologies) for Signal Integrity/High-Speed Test: Introspective ESP.[6]
References
- ↑ "About Us | Introspect Technology".
- ↑ "DFT Microsystems | crunchbase". www.crunchbase.com. Retrieved 2017-10-04.
- ↑ Lameiro, Christian (November 9, 2016). "Cross-validation techniques for determining the number of correlated components between two data sets when the number of samples is very small". IEEE.org. Archived from the original on
|archive-url=requires|archive-date=(help). - ↑ Nelson, Rick (January 27, 2013). › Magazine › 2013 "Introspect Technology Addresses Engineering Gap with Compact SerDes Instrument" Check
|archive-url=value (help). Evaluation Engineering. Archived from the original on|archive-url=requires|archive-date=(help). Retrieved January 27, 2013. - ↑ Porter, Jamie (January 28, 2015). "DesignCon 2015 Announces Winners of Best in Design & Test Awards and Names the Engineer of the Year". Cision PR Newswire. Retrieved January 16, 2018.
- ↑ Love, Janine (January 30, 2013). "Best in Test awards given out at DesignCon 2013". EDN Network. Retrieved January 16, 2018.
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