Mehrdad Nikoonahad
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| Mehrdad Nikoonahad | |
|---|---|
| Born | December 23, 1955 Tehran, Iran |
| 🏳️ Nationality | American |
| 🎓 Alma mater | University College London (University of London) |
| 💼 Occupation | |
| 🌐 Website | https://www.linkedin.com/in/nikoonahad/ |
Dr. Mehrdad Nikoonahad is an Iranian-American electrical engineer, technologist, innovator and entrepreneur.
Background and education[edit]
He received his B.Sc. and Ph.D. degrees in Electronic Engineering from University College London (UCL), England, in 1979 and 1983, respectively. Here, he also completed two years of postdoctoral work. His Ph.D. and postdoctoral work were concerned with acoustic imaging and microscopy[1] [2] [3] [4] [5] and were carried out under the supervision of Sir Eric Ash. He became a Senior Member of the IEEE by nomination in 1989. In 1997 he completed the Executive Program for Growing Companies at the Graduate School of Business of Stanford University.
Career and business interests[edit]
Dr. Nikoonahad was involved with a number of start-up, private, and public companies at the executive level, all in the high technology arena. He was Founder and CEO at Partoe Inc., a privately held company based in Silicon Valley, California, specialized in distributed power electronics for photovoltaic (PV) solar markets and microgrids. Prior to Partoe he co-founded and held the CEO position at Solar Notion, Inc., another privately held company also in Silicon Valley, dedicated to a radically new silicon process technology for PV module manufacturing.
He was formerly Vice President of Technology for Strategic Business Development at KLA Corporation. Prior to the merger of KLA and Tencor, he joined Tencor Instruments in Mountain View, California in 1992 when he proposed and helped develop a platform for a high-speed, laser-based, wafer inspection system, which, then for the first time, addressed the inspection needs for 250 nanometer semiconductor device fabrication technology during high volume production. That platform was subsequently named Advanced Inspection Technology (AIT) and helped the chip fabrication industry in a significant way. He then managed development groups and extended that capability for smaller silicon geometries, using UV lasers. Subsequent to the AIT, he led a number of development teams for inspection and metrology products used in silicon processing manufacturing. Laser imaging, metals and dielectric thin film metrology, laser and spectral ellipsometry for dielectric film characterization, photothermal ellipsometry for implant measurement, chemical-mechanical planarization (CMP) end-point detection, optical CD (OCD), overlay characterization, and micro/macro defect inspection are among some the technologies that Nikoonahad and his teams have developed. He was Vice President of Technology for a new division of KLA dedicated to integrated meteorology. He also held an advisory role for the KLA Venture Fund and was a member of the corporate Patent Review Committee. He was the winner of numerous innovation and patent awards while at KLA.
Prior to KLA he was at Philips Research Laboratories in New York where he served as Senior Member Research Staff and led research on acoustic imaging, and medical ultrasound. Nikoonahad has been principal investigator on a number R&D projects for the NASA and the NIH.
He has contributed as an author to more than 50 scientific papers, including a book chapter and is a named inventor on over 100 US patents and patent applications.
In 2019 he was invited as visiting professor[6] at the Department of Economics and Management of University of Trento, Italy where he was involved with teaching technology entrepreneurship at the Start-up Lab, a renowned international program, inspired by Y Combinator, that selects startup projects that have potential to scale globally.
Selected publications[edit]
1. M. Nikoonahad, S.L. Lee and H. Wang (2000), “Picosecond Photoacoustics using Common Path interferometry”, Appl. Phys. Letts., Vol 76, pp 514-516.
2. M. Nikoonahad, S. A. Biellak and Z. Yan (1998), “Laser-induced Fluorescence Spectroscopy and Imaging of Semiconductor Wafers,” IEEE Transactions on Semiconductor Manufacturing, Vol. 11, no. 2, pp 246-253.
3. M. Nikoonahad, C. Wayman C. and S.A. Biellak (1997), “Defect Detection Algorithm for Wafer Inspection based on Laser Scanning,” IEEE Transaction on Semiconductor Manufacturing, vol 10, no 4, pp 459- 468.
4. M. Nikoonahad M., B.C. Leslie, S.E. Stokowski, B. M. Trafas and K. B. Wells (1995), “New Laser Scanning Techniques for Wafer Inspection,” in SPIE Proceedings on Optical Characterization Techniques for High-performance Microelectronic Device Manufacturing II, Vol 2638, pp 286-301.
5. M. Nikoonahad, P.R. Rigg, M. Sondossi, K. B. Wells, B.C. Leslie (1995), “In Situ Height Correction for Laser Scanning of Semiconductor Wafers,” Optical Engineering 34(10), pp 3036-3039.
6. M. Nikoonahad and D.C. Liu (1990), "Medical Ultrasound Imaging using Neural Networks," Elect. Letts. Vol 26, No 8, pp 545-546.
7. M. Nikoonahad and D.C. Liu (1990),"Pulse-Echo Single Frequency Acoustic Nonlinearity Parameter (B/A) Measurement," IEEE UFFC Trans., Vol 37, No 2, pp 127-134.
8. M. Nikoonahad and T.L. Pusateri (1989),"Ultrasonic Phase Conjugation," Jour. Appl. Phys., Vol 66, No 9, pp 4512-4513.
9. M. Nikoonahad and M. Vaez Iravani (1989), "Focusing Ultrasound in Biological Media," IEEE Transactions on UFFC, Vol 36, No. 2, pp 209-215.
10. M. Nikoonahad and F. Li (1988), "High Resolution Ultrasound Transverse Flow Measurement," Elect. Letts. 24(4), pp 205-207.
11. M. Nikoonahad (1987), "Differential Amplitude Contrast in Acoustic Microscopy,” Appl. Phys. Letts., 51(21), pp 1687-1689.
12. M. Vaez Iravani and M. Nikoonahad (1987), "Photothermal Waves in Anisotropic Media,” Jour. Appl. Phys., 62(10), pp 4065-4071.
13. M. Nikoonahad (1987), "Differential Phase Contrast Acoustic Microscopy using Tilted Transducers,” Elect. Letts. 23(10), pp. 489 490.
14. M. Nikoonahad (1986), "Synthetic Focused Image Reconstruction in the Presence of a Finite Delay Noise,” Proc. of IEEE Ultrasonics Symposium 86CH2375 4, pp. 819 824.
15. M. Nikoonahad, G.Q. Yue and E.A. Ash (1985), "Pulse Compression Acoustic Microscopy using SAW filters," IEEE Trans. on Sonics and Ultrasonics, Special Issue on Acoustic Microscopy SU(32) No.2, pp. 152 163.
16. M. Nikoonahad and E.A. Ash (1985), "Resolution of Scanning Ultrasonic Imaging Systems with Arbitrary Transducer Excitation,” Revue Phys. Appl.20, pp. 383 389.
17. M. Vaez Iravani and M. Nikoonahad (1984), "Transform Techniques for Analysis of Thermal wave Propagation in Anisotropic composite Materials,” Jour. NDE, Vol 4, No. 3, pp. 147 153.
18. M. Nikoonahad (1984), "Reflection Acoustic Microscopy for Industrial NDE" in Research Techniques for Nondestructive Testing (R.S. Sharpe Ed.), Chapter 7, Vol 7, pp. 217 257, Academic Press, New York.
19. M. Nikoonahad (1984), "Recent Advances in High Resolution Acoustic Microscopy," Contemp. Phys. 25(2), pp. 129 158.
References[edit]
- ↑ Quate, C.F.; Atalar, A.; Wickramasinghe, H.K. (August 1979). "Acoustic microscopy with mechanical scanning—A review". Proceedings of the IEEE. 67 (8): 1092–1114. doi:10.1109/PROC.1979.11406. hdl:11693/50766. Retrieved September 25, 2023. Unknown parameter
|s2cid=ignored (help) - ↑ "Scientists use sound to see through solids". New Scientist. June 10, 1982. Retrieved 24 June 2011.
- ↑ Nikoonahad, Mehrdad (1984). "Recent Advances in High Resolution Acoustic Microscopy". Contemporary Physics. 25 (2): 129–158. Bibcode:1984ConPh..25..129N. doi:10.1080/00107518408230325. Retrieved September 25, 2023.
- ↑ Maev, Roman Gr (2009). Acoustic Microscopy: Fundamentals and Applications 1st Edition. John Wiley & Sons. ISBN 978-3527407446. Search this book on
- ↑ Acoustic Microscopy. OUP Oxford. September 17, 2009. ISBN 978-0199232734. Retrieved September 25, 2023. Search this book on
- ↑ "Mehrdad Nikoonahad | CLab Trento". clabtrento.it. Retrieved 2020-04-09.
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